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Makino, Takahiro; Oshima, Takeshi; Iwamoto, Naoya; Onoda, Shinobu; Nozaki, Shinji*; Kojima, Kazutoshi*
no journal, ,
no abstracts in English
Ito, Hisayoshi
no journal, ,
As closing remarks of the JSAP symposium entitled "Progress of SiC power electronics development towards Green Innovation", all the contents presented there will be summarized and concluded.
-FeSi
single crystal with sputter-etch treatmentYamaguchi, Kenji; Matsumura, Seidai*; Yamanaka, Yusuke*; Hojo, Kiichi; Udono, Haruhiko*
no journal, ,
no abstracts in English
Oba, Hironori; Saeki, Morihisa; Sasaki, Yuji
no journal, ,
no abstracts in English
/SiC interface atomic model generated by first-principals molecular dynamics methodMiyashita, Atsumi; Onuma, Toshiharu*; Tsuchida, Hidekazu*; Yoshikawa, Masahito
no journal, ,
no abstracts in English
Ito, Takuto*; Deki, Manato; Matsuo, Shigeki*; Hashimoto, Shuichi*; Kitada, Takahiro*; Isu, Toshiro*; Onoda, Shinobu; Oshima, Takeshi
no journal, ,
no abstracts in English
Abe, Hiroshi; Kishimoto, Masahiko*; Muraki, Keita*; Uchida, Hirohisa*; Oshima, Takeshi
no journal, ,
no abstracts in English
Ono, Shinya*; Inoue, Kei*; Morimoto, Masahiro*; Arae, Sadanori*; Toyoshima, Hiroaki*; Yoshigoe, Akitaka; Teraoka, Yuden; Ogata, Shoichi*; Yasuda, Tetsuji*; Tanaka, Masatoshi*
no journal, ,
no abstracts in English
Takahashi, Ryota*; Handa, Hiroyuki*; Abe, Shunsuke*; Inomata, Shuya*; Imaizumi, Kei*; Fukidome, Hirokazu*; Teraoka, Yuden; Yoshigoe, Akitaka; Kotsugi, Masato*; Okochi, Takuo*; et al.
no journal, ,
no abstracts in English
-FeSi substrate under Si vapor and homoepitaxyMatsumura, Seidai*; Yamanaka, Yusuke*; Udono, Haruhiko*; Yamaguchi, Kenji; Esaka, Fumitaka; Hojo, Kiichi
no journal, ,
no abstracts in English
Kada, Wataru; Yokoyama, Akihito; Koka, Masashi; Sato, Takahiro; Kamiya, Tomihiro
no journal, ,
An Ion Beam-Induced Luminescence analysis system using micro-beam (micro-IBIL) was newly developed and combined with micro-PIXE analysis system to obtain images of chemical-state (i.e. electrical charge distribution) distribution of the targets. Photon signals from the interactions of ions with outer shell electrons was visualized by panchromatic and wavelength dispersive micro-IBIL imaging by the developed system. Micro-IBIL experiments were performed using 3-MeV proton micro-beam with several sample of scintillators and aerosol particles. The system had successfully achieved chemical-imaging of aerosols by obtaining wavelength-dispersive micro-IBIL image at luminescence center of silicon dioxide (around 425 nm). It is so far becomes possible to obtain crystal structure or chemical-state distribution of the sample by using monochromatic IBIL imaging by the developed system.
Suzuki, Masayuki; Kiriyama, Hiromitsu; Daito, Izuru; Okada, Hajime; Sato, Masatoshi*; Yoshii, Takehiro*; Tamaoki, Yoshinori*; Matsuoka, Shinichi*; Kan, Hirofumi*; Bolton, P.; et al.
no journal, ,
no abstracts in English
Ikuta, Tomoya; Itakura, Ryuji; Hosaka, Koichi*; Yokoyama, Atsushi; Yamanouchi, Kaoru*; Kannari, Fumihiko*
no journal, ,
We investigate the dissociative ionization dynamics of ethanol in two color (UV-NIR) laser fields using photoelectron-photoion coincidence momentum imaging. The details of the ionization dynamics for the respective reaction channels are elucidated. The reaction mechanism in terms of the electronic excitation is discussed.
CoSi, CoFeSi/Ge heterointerfacesMatsukura, Bui*; Narumi, Kazumasa; Sakai, Seiji; Hamaya, Kohei*; Miyao, Masanobu*; Maeda, Yoshihito
no journal, ,
no abstracts in English
Yasuda, Ryo; Nojima, Takehiro; Matsubayashi, Masahito
no journal, ,
no abstracts in English
induced by swift heavy-ion irradiationSasase, Masato*; Okayasu, Satoru; Yamamoto, Hiroyuki
no journal, ,
Shape transformation of Au nanoparticles in SiO has been performed by by swift heavy-ion irradiation.
Nishiuchi, Mamiko; Pirozhkov, A. S.; Ogura, Koichi; Tanimoto, Tsuyoshi; Sakaki, Hironao; Hori, Toshihiko; Sagisaka, Akito; Yogo, Akifumi; Fukuda, Yuji; Kanasaki, Masato; et al.
no journal, ,
We present the results of the experiment of laser-driven proton acceleration with the interaction between laser and thin foil target. The maximum energy of the laser-driven protons increases as the intensity of the laser increases. In order to accelerate the proton beam toward higher energy with the limited energy of laser, we need to increase the intensity of the laser. For that purpose, we upgraded the laser mirrors in the beam line. As a result the intensity of the laser increases about one oreder of magnitude. With the tape target, we obtain proton beam whose maximum energy is 23 MeV. We also conducted the plasma mirror to increase the contrast of the laser. We show the detail of the proton acceleration results with the plasma mirror.
Sasaki, Akira; Nishihara, Katsunobu*; Sunahara, Atsushi*; Furukawa, Hiroyuki*; Nishikawa, Takeshi*; Koike, Fumihiro*
no journal, ,
no abstracts in English
Fukuda, Yuji; Sakaki, Hironao; Hori, Toshihiko; Tampo, Motonobu; Kurashima, Satoshi; Kamiya, Tomihiro; Kondo, Kiminori; Kanasaki, Masato; Yamauchi, Tomoya*
no journal, ,
A new diagnosis method for high energy ion beam has been developed utilizing backscattered particles. A single 100-
m thick CR-39 detector mounted on a 3-mm thick backscatterer was irradiated with 
He
ions with an energy of 25 MeV/
. Although this energy is too high to create etchable tracks on both surfaces of the CR-39, we found that a number of elliptical pits as well as circular ones were created on the rear surface. The existence region of the elliptical pits well reproduced the initial ion beam pattern. Detailed investigation of growth pattern of each pit size revealed that most of etch pits in the rear surface were created by backscattered He particles. The results indicate that using this method it is possible to identify energy, number, and profile of high energy ion beam which is insensitive to CR-39.
Kanasaki, Masato; Yamauchi, Tomoya*; Fukuda, Yuji; Sakaki, Hironao; Hori, Toshihiko; Tampo, Motonobu; Kondo, Kiminori
no journal, ,
A new diagnosis method for high energy ion beam has been developed utilizing backscattered particles. A single 100-m thick CR-39 detector mounted on a 3-mm thick backscattered was irradiated with 
He ions with an energy of 25 MeV/. Although this energy is too high to create etchable tracks on both surfaces of the CR-39, we found that a number of elliptical pits as well as circular ones were created on the rear surface. The existence region of the elliptical pits well reproduced the initial ion beam pattern. Detailed investigation of growth pattern of each pit size revealed that most of etch pits in the rear surface were created by backscattered He particles. The results indicate that using this method it is possible to identify energy, number, and profile of high energy ion beam which is insensitive to CR-39.